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Methodology to Improve Strain Measurement in III-V Semiconductors Materials
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1416-1417
- Print publication:
- July 2017
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Atomap - Automated Analysis of Atomic Resolution STEM Images
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 426-427
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- July 2017
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Materials Development Aided by Atomic-Resolution Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1515-1516
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- August 2015
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Using (S)TEM Techniques to Study Energy Related Materials at the Nanoscale
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 414-415
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- August 2014
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Characterization of ZnO Nanostructures Grown by Pulsed Laser Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1174 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1174-V07-09
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- 2009
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